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Cover Image for A review of micro-scale focused ion beam milling and digital image correlation analysis for residual stress evaluation and error estimation

A review of micro-scale focused ion beam milling and digital image correlation analysis for residual stress evaluation and error estimation

Alexander J.G. Lunt, Alexander M. Korsunsky

Dec 15, 2015

In the past decade several versions of micro-scale residual stress analysis techniques have been developed based on Focused Ion Beam (FIB) milling at sample surface followed by Digital Image Correlation (DIC) for the...

Digital image correlation Error estimation Focused ion beam Residual stress Ring core /dk/atira/pure/subjectarea/asjc/1600/1600 name=General Chemistry /dk/atira/pure/subjectarea/asjc/3100/3104 name=Condensed Matter Physics /dk/atira/pure/subjectarea/asjc/3100/3110 name=Surfaces and Interfaces /dk/atira/pure/subjectarea/asjc/2500/2508 name=Surfaces, Coatings and Films /dk/atira/pure/subjectarea/asjc/2500/2505 name=Materials Chemistry

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Enhanced quantification for 3D SEM-EDS

Pierre Burdet, SA Croxall, PA Midgley

Oct 08, 2014

3D chemical analysis 3D image analysis 3D microanalysis Energy dispersive X-ray spectrometry Focused ion beam Quantification Tomographic spectral imaging

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A review of micro-scale focused ion beam milling and digital image correlation analysis for residual stress evaluation and error estimation

Alexander J.G. Lunt, Alexander M. Korsunsky

Dec 15, 2015

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Practical Issues for Atom Probe Tomography Analysis of III-Nitride Semiconductor Materials.

Fengzai Tang, Michael P Moody, Tomas L Martin, Paul AJ Bagot, Menno J Kappers, Rachel A Oliver

May 26, 2015

Ga implantation GAN III-nitrides InAlN atom probe tomography Focused ion beam

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Cover Image for A state-of-the-art review of micron-scale spatially resolved residual stress analysis by FIB-DIC ring-core milling and other techniques

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A state-of-the-art review of micron-scale spatially resolved residual stress analysis by FIB-DIC ring-core milling and other techniques

Alexander J.G. Lunt, Nikolaos Baimpas, Enrico Salvati, Igor P. Dolbnya, Tan Sui, Siqi Ying, Hongjia Zhang, Annette K. Kleppe, Jiri Dluhoš, Alexander M. Korsunsky

Oct 01, 2015

Quantification of residual stress gradients can provide great improvements in understanding the complex interactions between microstructure, mechanical state, mode(s) of failure and structural integrity. Highly focused local...

Digital image correlation Focused ion beam micro-scale Residual stress Ring-core X-Ray Diffraction /dk/atira/pure/subjectarea/asjc/2600/2611 name=Modelling and Simulation /dk/atira/pure/subjectarea/asjc/2200/2211 name=Mechanics of Materials /dk/atira/pure/subjectarea/asjc/2200/2210 name=Mechanical Engineering /dk/atira/pure/subjectarea/asjc/2600/2604 name=Applied Mathematics

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A state-of-the-art review of micron-scale spatially resolved residual stress analysis by FIB-DIC ring-core milling and other techniques

Alexander J.G. Lunt, Nikolaos Baimpas, Enrico Salvati, Igor P. Dolbnya, Tan Sui, Siqi Ying, Hongjia Zhang, Annette K. Kleppe, Jiri Dluhoš, Alexander M. Korsunsky

Oct 01, 2015

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