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Results: 1
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Directly correlated microscopy of trench defects in InGaN quantum wells.
TJ O'Hanlon
,
FC-P Massabuau
,
A Bao
,
MJ Kappers
,
RA Oliver
Feb 23, 2021
gallium nitride
Multi-microscopy
Properties correlation
quantum well
Sample preparation
trench defect
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