Countable families of global-in-time and blow-up similarity sign-changing patterns of the Cauchy problem for the fourth-order thin film equation (TFE-4) ut= -del . (|u|(n)del Delta u) in R(N) x R(+), where n > 0, are studied....
Countable families of global-in-time and blow-up similarity sign-changing patterns of the Cauchy problem for the fourth-order thin film equation (TFE-4) ut= -del . (|u|(n)del Delta u) in R(N) x R(+), where n > 0, are studied....