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Electronic Structure of Low-Temperature Solution-Processed Amorphous Metal Oxide Semiconductors for Thin-Film Transistor Applications.
Josephine Socratous
,
Kulbinder K Banger
,
Yana Vaynzof
,
Aditya Sadhanala
,
Adam D Brown
,
Alessandro Sepe
,
Ullrich Steiner
,
Henning Sirringhaus
OAI: oai:www.repository.cam.ac.uk:1810/247541
Published by:
Abstract
indium–zinc oxide
Nitrates
solution-processing
spectroscopy
subgap density of states