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Connecting defects and amorphization in UiO-66 and MIL-140 metal-organic frameworks
TD Bennett, TK Todorova, EF Baxter, DG Reid, C Gervais, B Bueken, B Van De Voorde, D De Vos, DA Keen, C Mellot-Draznieks
OAI: oai:www.repository.cam.ac.uk:1810/252848