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Nano-cathodoluminescence reveals the effect of electron damage on the optical properties of nitride optoelectronics and the damage threshold
JT Griffiths, S Zhang, J Lhuillier, D Zhu, WY Fu, A Howkins, I Boyd, D Stowe, DJ Wallis, CJ Humphreys, RA Oliver
OAI: oai:www.repository.cam.ac.uk:1810/261616 • DOI: 10.17863/CAM.6825