Determination of the Poisson ratio of (001) and (111) oriented thin films of In(2)O(3) by synchrotron-based x-ray diffraction

K H L Zhang, A Regoutz, R G Palgrave, D J Payne, R G Egdell, Aron Walsh, S P Collins, D Wermeille, R A Cowley

OAI: oai:purehost.bath.ac.uk:publications/90fb37f3-96f7-40d5-a375-577961ce9425 • DOI: https://doi.org/10.1103/PhysRevB.84.233301

The Poisson ratio. of In(2)O(3) has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO(2) substrates. The experimental results are in good agreement with values for. calculated using atomistic simulation procedures.