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Full Field Imaging Ellipsometry (FFIE) Platform Using CCD Camera and Advanced Software for Simultaneous Spots' Sensing and Measurement
This article describes a new approach for performing full field imaging ellipsometry. In this new technique, the objective lens of a high numerical aperture microscope is used to illuminate the surface of a 2D object. The light...
Improving Interferometry Instrumentation by Mixing Stereoscopy for 2π Ambiguity Solving
Phase measurements obtained by high-coherence interferometry are restricted by the 2π ambiguity to height differences smaller than λ/2. A further restriction considers linear and nonlinear aberrations evolving in most...